« Seven different types of low-loss dielectric
materials were measured using such an MCK operating at 50-75 GHz, and the extracted
dielectric constant and loss tangent values show good agreement with values published in the
open literature.[…] A new method based on MCK is an attractive alternative approach to the
conventional free-space technique, for material characterization at millimeter-wave and
terahertz frequencies. »
Characterization of Dielectric Materials at WR-15 band
(50-75 GHz) using VNA-based Technique. Yi Wang, Student Member, IEEE, Xiaobang Shang, Senior
Member, IEEE, Nick Ridler, Fellow, IEEE, Tongde Huang, Wen Wu, Senior Member, IEEE