The MCK is a convenient way to measure dielectric properties:

ε - permittivity
tan δ - loss tangent
in bands between 25 GHz and 1100 GHz

Our advantages

The Material Characterization Kit (MCK) is a dielectric material characterization solution in bands over a wide frequency range between 25 GHz and 1100 GHz. Dielectric properties of materials can be measured in a quick, convenient, and reliable way.

Permittivity error ε_r ± 1%
Loss tangent error tanδ ± 2%
Reflexion < -20dB
Mode purity 98%

Plug-and-play solution
Two-clicks calibration
One-click measurements
No sample preparation

Results are repeatable
Broadband solution
Self-aligned sample positioning
Swiss made

Solutions available over frequency bands

WR-28 25 - 40 GHz
WR-22 33 - 50 GHz
WR-19 40 - 60 GHz
WR-15 47 - 75 GHz
WR-12 55 - 90 GHz
WR-10 67 - 110 GHz
WR-8.0 90 - 140 GHz
WR-6.5 110 - 170 GHz
WR-5.1 140 - 220 GHz
WR-4.3 170 - 260 GHz
WR-3.4 220 - 330 GHz
WR-2.8 260 - 400 GHz
WR-2.2 330 - 500 GHz
WR-1.5 500 - 750 GHz
WR-1.0 750 - 1100 GHz

Starting from 22’100 CHF.
Typically available within 3 months.

1
MCK
2
Protective caps
3
Calibration short
4
Screws to connect cables
5
Peli protector case

How it works

Testimonials

« MCK is an easy to use test bench due to its hardware and software. It drives the VNA from a computer through Ethernet (no need administrator privileges) and allows saving time with no need of classical s2p calibration on cables. The measurements are repeatable and the included calliper simplifies the work. »

Serge TSEKHANOVICH, Radiall

« Seven different types of low-loss dielectric materials were measured using such an MCK operating at 50-75 GHz, and the extracted dielectric constant and loss tangent values show good agreement with values published in the open literature.[…] A new method based on MCK is an attractive alternative approach to the conventional free-space technique, for material characterization at millimeter-wave and terahertz frequencies. »

Characterization of Dielectric Materials at WR-15 band (50-75 GHz) using VNA-based Technique. Yi Wang, Student Member, IEEE, Xiaobang Shang, Senior Member, IEEE, Nick Ridler, Fellow, IEEE, Tongde Huang, Wen Wu, Senior Member, IEEE

Requirements

The MCK is an easy-to-use device accessible to all levels of expertise. To perform measurements you only need your MCK, a VNA, and your sample.

A vector network analyzer (VNA) with time domain extension covering the frequencies corresponding with your MCK.

A recommended size for a solid sample is 50x50x5 mm. Boundary case: 18x18 mm - minimal surface, 21 mm - maximal thickness. Recommended and boundary sizes may vary with a model and type of material.

Complementary products

Calibrated holders

Standard MCK has been developed for solid samples. For all other material types, SWISSto12 can provide with an appropriate solution. Already available:

Soft and foams
Liquids and powders
Coatings and multilayers

WebMCK software

SWISSto12 has developed the software with easy interface for easy extraction of material properties in couple of minutes.

A full automation of measurement process:

Available for all the main OS
No installation required
Compatible with most VNA mainframes

The MCK is a convenient way to measure dielectric properties:

Our advantages

Solutions available over frequency bands

How it works

Testimonials

Requirements

Complementary products

Calibrated holders

WebMCK software

Request for quotation

Frequency range of interest

Select your material

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